Difference between revisions of "MainPage:Nuclear:NPS:PWO:CrystalLOG:SICCAJ40"

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| 04/29/2016 || Thermal annealing || Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
 
| 04/29/2016 || Thermal annealing || Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
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| 05/15/2016 ||  Crystal Cracked || Crystal was slightly cracked toward the edges due to an accident. Some pieces of this crystal will be used to measure the chemical composition.
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| 05/19/2016 || Light Yield || Run 3210: crystal wrapped with ~5 layers of teflon tape and 2 layers of black electrical tape. Steps of 20min, 1cm. T=18°C. LY = 13.947 ± 0.766 pe/MeV.
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| 05/20/2016 || Transverse Transmittance|| At the center of the crystal, every nm from 200nm until 800nm. Sample: 1354
 
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| 05/20/2016 || Transverse Transmittance Scan || Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.
 
| 05/20/2016 || Transverse Transmittance Scan || Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.

Revision as of 19:03, 21 May 2016

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Time LOG

SICCA J40
Date Description Comments
04/29/2016 Pictures Documentation of crystal's conditions as it arrived at CUA.
04/29/2016 Thermal annealing Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
05/15/2016 Crystal Cracked Crystal was slightly cracked toward the edges due to an accident. Some pieces of this crystal will be used to measure the chemical composition.
05/19/2016 Light Yield Run 3210: crystal wrapped with ~5 layers of teflon tape and 2 layers of black electrical tape. Steps of 20min, 1cm. T=18°C. LY = 13.947 ± 0.766 pe/MeV.
05/20/2016 Transverse Transmittance At the center of the crystal, every nm from 200nm until 800nm. Sample: 1354
05/20/2016 Transverse Transmittance Scan Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.

Pictures at 04/29/2016

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