Difference between revisions of "MainPage:Nuclear:NPS:PWO:CrystalLOG:SICCAJ19"

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| 07/21/2016 || Light Yield || Run:3236 3 layers of teflon tape and 1 layer of elecrtical. ~50,000 incidents recorded at ~18 degrees Celsius.
 
| 07/21/2016 || Light Yield || Run:3236 3 layers of teflon tape and 1 layer of elecrtical. ~50,000 incidents recorded at ~18 degrees Celsius.
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Revision as of 10:18, 24 July 2016

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⇐ Back to Neutral Particle Spectrometer
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Time LOG

SICCA J19
Date Description Comments
12/14/2015 Pictures Documentation of crystal's conditions as it arrived at CUA.
12/15/2015 Thermal annealing Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
12/17/2015 Transverse Transmittance Scan at 360, 420, and 620nm.
12/18/2015 Irradiation 160 keV photons at 6mA, for 10min.
12/18/2015 Transverse Transmittance Scan at 360, 420, and 620nm after 30 min of irradiation.
01/06/2016 LY scan At 100ns, as described in run 3097.
03/04/2016 Transverse Transmittance At the center of the crystal, every nm from 200nm until 800nm. Sample: 1314
03/04/2016 Dimensions Crystal's dimensions measured. Length and six points of width (3 in each face).
05/23/2016 Transverse Transmittance Scan Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/05/2016 Longitudinal Transmittance Scan Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/21/2016 Light Yield Run:3236 3 layers of teflon tape and 1 layer of elecrtical. ~50,000 incidents recorded at ~18 degrees Celsius.

Pictures at 12/14/2015

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