Difference between revisions of "MainPage:Nuclear:NPS:PWO:CrystalLOG:SICCAJ43"

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| 07/08/2016 || Longitudinal Transmittance Scan || Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
 
| 07/08/2016 || Longitudinal Transmittance Scan || Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
 
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| 07/26/2016 || Light Yield || 3 layers of teflon tape, 1 layer of electrical tape. ~50,000 incidents Light Yield: 13.33377558 pe/MeV
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| 07/26/2016 || Light Yield || Run:3257. 3 layers of teflon tape, 1 layer of electrical tape. ~50,000 incidents Light Yield: 13.33377558 pe/MeV
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|-
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|08/04/16 || Light Yield || 3 layers of teflon 1 later of electrical. ~50,000 incidents at ~18 degrees Celsius. 200ns gatewidth->1000ns gatewidth.
 +
200ns: 3358, 300ns:3359, 400ns:3360, 500ns:3361, 600ns:3362, 700ns:3363, 800ns:3364: 900ns:3365, 1000ns:3366
 
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| valign="top"|
 
| valign="top"|
 
[[File:SICCAJ43.JPG|thumb|center|340px|xxxx.]]
 
[[File:SICCAJ43.JPG|thumb|center|340px|xxxx.]]
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== Light Yield ==
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{|border="0" style="text-align:center;" width="100%"
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[[File:J43-100nsgw.png|thumb|left|340px| 07/25/2016]]
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== Light Yield Gate Width==
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{|border="0" style="text-align:center;" width="100%"
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[[File:J43-100-900 gw.png|thumb|left|340px| 07/27/2016]]
 
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Revision as of 10:59, 11 August 2016

⇐ Back to Crystal LOG
⇐ Back to Neutral Particle Spectrometer
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Time LOG

SICCA J43
Date Description Comments
05/02/2016 Pictures Documentation of crystal's conditions as it arrived at CUA.
05/02/2016 Thermal annealing Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
05/19/2016 Transverse Transmittance At the center of the crystal, every nm from 200nm until 800nm. Sample: 1358
05/20/2016 Transverse Transmittance Scan Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.
05/22/2016 Light Yield Run 3218: crystal wrapped with ~5 layers of teflon tape and 2 layers of black electrical tape. Steps of 20min, 1cm. T=18°C. LY = 15.40 ± 0.716 pe/MeV.
07/08/2016 Longitudinal Transmittance Scan Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/26/2016 Light Yield Run:3257. 3 layers of teflon tape, 1 layer of electrical tape. ~50,000 incidents Light Yield: 13.33377558 pe/MeV
08/04/16 Light Yield 3 layers of teflon 1 later of electrical. ~50,000 incidents at ~18 degrees Celsius. 200ns gatewidth->1000ns gatewidth.

200ns: 3358, 300ns:3359, 400ns:3360, 500ns:3361, 600ns:3362, 700ns:3363, 800ns:3364: 900ns:3365, 1000ns:3366

Pictures at 04/29/2016

xxxx.
xxxx.

Light Yield

07/25/2016

Light Yield Gate Width