Difference between revisions of "MainPage:Nuclear:NPS:PWO:CrystalLOG:SICCAJ41"

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| 07/08/2016 || Longitudinal Transmittance Scan || Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
 
| 07/08/2016 || Longitudinal Transmittance Scan || Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
 
|-
 
|-
−
| 07/26/2016 || Light Yield || 3 layers of teflon tape, 1 layer of electrical tape. ~50,000 incidents
+
| 07/26/2016 || Light Yield || Run: 3255. 3 layers of teflon tape, 1 layer of electrical tape. ~50,000 incidents. Light Yield: 13.40011277 pe/MeV
 +
|-
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|07/27/16 || Light Yield || 3 layers of teflon 1 later of electrical. ~50,000 incidents at ~18 degrees Celsius. 200ns gatewidth->900ns
 +
gatewidth.
 +
200ns: 3321, 300ns:3322, 400ns:3323, 500ns:3324, 600ns:3325, 700ns:3328, 800ns:3329, 900ns:3330
 +
|-
 +
| 07/07/2017 || Longitudinal Transmittance Scan || Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
 +
|-
 +
| 07/10/2017 || Light Yield || Run 3694. 100ns gw. ~50,000 incidents ~3 layers of teflon tape ~1 layer of electrical. LY=7.509 pe/MeV.
 +
|-
 +
| 08/01/2017 || Summer Students || Transverse Transmittance Scan --Wavelengths: 200-800 nm. 10cm down.
 +
|-
 +
| 08/01/2017 || Summer Students || Xray Radiation  70 minutes, 160mV, 6mA. ___ mm from beam origin. Wait time to transmittance measurement ~2 minutes... not constant.dk= 0.8562
 +
|-
 +
| 08/02/2017 || Summer Students || Transverse Transmittance Scan Wavelengths: 200-800 nm. 10cm down.
 +
|-
 +
| 08/02/2017 || Summer Students || LED curing 34 LEDs, 3.5 V for 7 minutes.
 +
|-
 +
| 08/02/2017 || Summer Students || Transverse Transmittance Scan-- Wavelengths: 200-800 nm. 10cm down.
 +
|-
 +
| 08/02/2017 || Summer Students || LED curing 34 LEDs, 3.5 V for 7 more minutes (14 total).
 +
|-
 +
| 08/02/2017 || Summer Students || Transverse Transmittance Scan-- Wavelengths: 200-800 nm. 10cm down.
 +
|-
 +
| 08/02/2017 || Summer Students || LED curing-- 34 LEDs, 3.5 V for 7 more minutes (21 total).
 +
|-
 +
| 08/02/2017 || Summer Students || Transverse Transmittance Scan--Wavelengths: 200-800 nm. 10cm down.
 +
 
 
|}
 
|}
  
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| valign="top"|
 
| valign="top"|
 
[[File:SICCAJ41.JPG|thumb|center|340px|xxxx.]]
 
[[File:SICCAJ41.JPG|thumb|center|340px|xxxx.]]
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|}
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== Light Yield ==
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{|border="0" style="text-align:center;" width="100%"
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|-
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| valign="top"|
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[[File:J41-100nsgw.png|thumb|left|340px| 07/26/2016]]
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|}
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== Light Yield Gate Width==
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{|border="0" style="text-align:center;" width="100%"
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|-
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| valign="top"|
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[[File:J41-100-900 gw.png|thumb|left|340px| 07/27/2016]]
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==Radiation Hardness==
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{|border="0" style="text-align:center;" width="100%"
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|-
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| valign="right"|
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[[File:J41IR.png|thumb|left|340px| 08/02/2017.dk= 0.8520606]]
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|}
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== LED Curing==
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{|border="0" style="text-align:center;" width="100%"
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|-
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| valign="top"|
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[[File:J41LED.png|thumb|left|340px| 08/02/2017]]
 
|}
 
|}

Latest revision as of 09:14, 3 August 2017

⇐ Back to Crystal LOG
⇐ Back to Neutral Particle Spectrometer
⇐ Back to the Main_Page

Time LOG

SICCA J41
Date Description Comments
04/29/2016 Pictures Documentation of crystal's conditions as it arrived at CUA.
04/29/2016 Thermal annealing Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour.
05/19/2016 Transverse Transmittance At the center of the crystal, every nm from 200nm until 800nm. Sample: 1355
05/20/2016 Light Yield Run 3216: crystal wrapped with ~5 layers of teflon tape and 2 layers of black electrical tape. Steps of 20min, 1cm. T=18°C. LY = 12.53 ± 0.672 pe/MeV.
05/20/2016 Transverse Transmittance Scan Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/08/2016 Longitudinal Transmittance Scan Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/26/2016 Light Yield Run: 3255. 3 layers of teflon tape, 1 layer of electrical tape. ~50,000 incidents. Light Yield: 13.40011277 pe/MeV
07/27/16 Light Yield 3 layers of teflon 1 later of electrical. ~50,000 incidents at ~18 degrees Celsius. 200ns gatewidth->900ns

gatewidth. 200ns: 3321, 300ns:3322, 400ns:3323, 500ns:3324, 600ns:3325, 700ns:3328, 800ns:3329, 900ns:3330

07/07/2017 Longitudinal Transmittance Scan Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s.
07/10/2017 Light Yield Run 3694. 100ns gw. ~50,000 incidents ~3 layers of teflon tape ~1 layer of electrical. LY=7.509 pe/MeV.
08/01/2017 Summer Students Transverse Transmittance Scan --Wavelengths: 200-800 nm. 10cm down.
08/01/2017 Summer Students Xray Radiation 70 minutes, 160mV, 6mA. ___ mm from beam origin. Wait time to transmittance measurement ~2 minutes... not constant.dk= 0.8562
08/02/2017 Summer Students Transverse Transmittance Scan Wavelengths: 200-800 nm. 10cm down.
08/02/2017 Summer Students LED curing 34 LEDs, 3.5 V for 7 minutes.
08/02/2017 Summer Students Transverse Transmittance Scan-- Wavelengths: 200-800 nm. 10cm down.
08/02/2017 Summer Students LED curing 34 LEDs, 3.5 V for 7 more minutes (14 total).
08/02/2017 Summer Students Transverse Transmittance Scan-- Wavelengths: 200-800 nm. 10cm down.
08/02/2017 Summer Students LED curing-- 34 LEDs, 3.5 V for 7 more minutes (21 total).
08/02/2017 Summer Students Transverse Transmittance Scan--Wavelengths: 200-800 nm. 10cm down.

Pictures at 04/29/2016

xxxx.
xxxx.

Light Yield

07/26/2016

Light Yield Gate Width

File:J41-100-900 gw.png
07/27/2016

Radiation Hardness

08/02/2017.dk= 0.8520606

LED Curing

08/02/2017
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