Difference between revisions of "MainPage:Nuclear:NPS:PWO:CrystalLOG:SICCAJ40"
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| 05/15/2016 || Crystal Cracked || Crystal was slightly cracked toward the edges due to an accident. Some pieces of this crystal will be used to measure the chemical composition. | | 05/15/2016 || Crystal Cracked || Crystal was slightly cracked toward the edges due to an accident. Some pieces of this crystal will be used to measure the chemical composition. | ||
|- | |- | ||
| − | | 05/19/2016 || Light Yield || Run | + | | 05/19/2016 || Light Yield || Run 3214: crystal wrapped with ~5 layers of teflon tape and 2 layers of black electrical tape. Steps of 20min, 1cm. T=18°C. LY = 14.7962 ± 0.575 pe/MeV. |
|- | |- | ||
| 05/20/2016 || Transverse Transmittance || At the center of the crystal, every nm from 200nm until 800nm. Sample: 1366 | | 05/20/2016 || Transverse Transmittance || At the center of the crystal, every nm from 200nm until 800nm. Sample: 1366 | ||
Revision as of 19:08, 21 May 2016
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| ⇐ Back to Neutral Particle Spectrometer |
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Time LOG
| Date | Description | Comments |
|---|---|---|
| 04/29/2016 | Pictures | Documentation of crystal's conditions as it arrived at CUA. |
| 04/29/2016 | Thermal annealing | Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour. |
| 05/15/2016 | Crystal Cracked | Crystal was slightly cracked toward the edges due to an accident. Some pieces of this crystal will be used to measure the chemical composition. |
| 05/19/2016 | Light Yield | Run 3214: crystal wrapped with ~5 layers of teflon tape and 2 layers of black electrical tape. Steps of 20min, 1cm. T=18°C. LY = 14.7962 ± 0.575 pe/MeV. |
| 05/20/2016 | Transverse Transmittance | At the center of the crystal, every nm from 200nm until 800nm. Sample: 1366 |
| 05/20/2016 | Transverse Transmittance Scan | Wavelengths: 360nm, 420nm, 620nm. Sampling period: 0.6s, moving motor at 2mm/s. |
