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Time LOG
| Date | Description | Comments |
|---|---|---|
| 12/14/2015 | Pictures | Documentation of crystal's conditions as it arrived at CUA. |
| 12/15/2015 | Thermal annealing | Ramp up at 18oC/hour up to 200oC. Stays for 10 hours and ramp down at 18oC/hour. |
| 12/17/2015 | Transverse Transmittance | Scan at 360, 420, and 620nm. |
| 12/18/2015 | Irradiation | 160 keV photons at 6mA, for 10min. |
| 12/18/2015 | Transverse Transmittance | Scan at 360, 420, and 620nm after 30 min of irradiation. |
| 01/07/2016 | LY scan | LY measurement with window width of 100ns, at 18oC (see run 3098). LY = 14.76 pe/MeV. |
| 03/04/2016 | Transverse Transmittance | At the center of the crystal, every nm from 200nm until 800nm. Sample: 1313 |
| 03/04/2016 | Dimensions | Crystal's dimensions measured. Length and six points of width (3 in each face). |
| 05/23/2016 | Transverse Transmittance Scan | Wavelengths: 200-800 nm. Sampling period: 0.6s, moving motor at 2mm/s. |
| 07/08/2016 | Longitudinal Transmittance Scan | Wavelengths: 200-800 nm. Measured effect of off-center placement of crystal on transmittance. +1.3°, +2.3°, -1.3°, -2.3. |
| 07/08/2016 | Longitudinal Transmittance Scan | Wavelengths: 200-800 nm. Measured light beam entering both end face of crystal in spectrometer. "flip" of crystal. |
| 07/23/2016 | Light Yield | Run: 3246. 3 layers of teflon tape and 1 of electrical. ~50.000 incidents and ~18 degrees Celsius |
| 07/28/2016 | Transverse Transmittance | At 10cm. 200-800nm wavelength. |
| 07/28/2016 | X-Ray Irradiation | 160kV, 6.3mA, 70 minutes. 6290 R/min. |
| 07/28/2016 | Transverse Transmittance (spectrometer failure) | Unsuccessful measurement of transmittance. |
Pictures at 12/14/2015
Light Yield |
