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Time LOG
Pictures 10/XX/2017
| Date | Experimenter | Description | Comments |
|---|---|---|---|
| 10/XX/2017 | Vladimir/Arshak | Visual Inspection | Documentation of crystal's conditions as it arrived at JLab. |
| 10/XX/2017 | Vladimir/Arshak | Dimensions | Measurement of length and area using calipers |
| 10/XX/2017 | Tanja | Thermal annealing | Ramp up at 18oC/hour up to 200oC. Stay for 10 hours and ramp down at 18oC/hour. |
| 10/XX/2017 | Tanja | Longitudinal Transmittance Scan | Wavelengths: 200-800nm. |
| 10/X/2017 | Tanja | Wrapped | Preparing for light yield measurement. 3 layers of teflon tape, and 2 layers of black tape. |
| 10/XX/2017 | Tanja | LY scan | Measurement of LY along crystal. More details in the LOGBOOK, runs xx.. |
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File:SICCAS 5039.JPG xxxx. | |
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File:SICCAS 5039 B.JPG xxxx. |
File:SICCAS 5039.JPG xxxx. |
Longitudinal and Transverse Transmittance (TT)
Light Yield
|
File:5039-100nsgw.png 10/XX/2017 |
Radiation Hardness
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File:5039 radiation hardness.png XX/XX/XXXX. Wait time to transmittance measurement ~15 minutes. |
